A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment-Reference-Cited by-同舟云学术

A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment

Published:2021-12 Issue:5-6 Volume:37 Page:675-684
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Yoshikawa Takefumi^ORCID,Ishimaru Masahiro,Iwata Tatsuya,Mori Fuma,Kobayashi Kazutoshi

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

https://link.springer.com/content/pdf/10.1007/s10836-021-05972-y.pdf

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5. Bryan MO et al (2003) Single event effects results for candidate spacecraft electronics for NASA. in Proc. IEEE Radiation Effects Data Workshop, Workshop Record, pp 65–75

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