Low Cost BIST for Static and Dynamic Testing of ADCs-Reference-Cited by-同舟云学术

Low Cost BIST for Static and Dynamic Testing of ADCs

Published:2005-06 Issue:3 Volume:21 Page:283-290
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Da Gloria Flores Maria,Negreiros Marcelo,Carro Luigi,Susin Altamiro A.,Clayton Felipe R.,Benevento Cristiano

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-005-6357-5.pdf

Reference26 articles.

1. F. Adamo et al., ?FFT Test of A/D Converter to Determine the Integral Nonlinearity Error,? in Proc. IEEE Instrumentation and Measurement Technology Conference, IMTC?01, 2001, pp. 710?714.

2. Analog Devices web site (http://www.analog.com)

3. K. Arabi and B. Kaminska, ?Efficient and Accurate Testing of Analog-to-Digital Converters using Oscillation-Test Method,? in Proc. European Design & Test Conf., DATE?97, pp. 348?352, 1997.

4. F. Azaïs, S. Bernard, Y. Bertrand, and M. Renovell, ?Implementation of a Linear Histogram BIST for ADC,? in Proc. of Intl Test Conf., ITC?00, 2000, pp. 590?595.

5. D. Bellan, A. Brandolini, and A. Gandeli, ?ADC nonlinearities and harmonic distortion in FFT test,? in Proc. IEEE Instrumentation Measurement Technology Conf., 1998, pp. 1233?1238.

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