Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients-Reference-Cited by-同舟云学术

Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients

Published:2012-08-28 Issue:5 Volume:28 Page:757-771
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Sindia Suraj,Agrawal Vishwani D.,Singh Virendra

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-012-5326-z.pdf

Reference17 articles.

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2. Chakravarty S, Thadikaran PJ (1997) Introduction to IDDQ testing. Springer

3. Cherubal S, Chatterjee A (2001) Test generation based diagnosis of device parameters for analog circuits. In: Proc design, automation and test in Europe conf, pp 596–602

4. Devarayanadurg G, Soma M (1994) Analytical fault modeling and static test generation for analog ICs. In: Proc int conf on computer-aided design, pp 44–47

5. Farchy SL, Gadzheva ED, Raykovska LH, Kouyoumdjiev TG (1995) Nullator-norator approach to analogue circuit diagnosis using general-purpose analysis programmes. Int J Circuit Theory Appl 23(6):571–585

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