Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-013-5423-7.pdf
Reference23 articles.
1. Analog Devices. ADXL001 Datasheet, http://www.analog.com/static/imported-files/data_sheets/ADXL001.pdf
2. Belete D, Razdan A, Schwarz W, Raina R, Hawkins C, Morehead J (2002) Use of DFT techniques in speed grading a 1 GHz+ microprocessor. Test Conference, 2002. Proc Int pp 1111–1119. doi: 10.1109/TEST.2002.1041868
3. Chaehoi A, Mailly F, Latorre L, Nouet P (2006) Experimental and finite-element study of convective accelerometer on CMOS. Sensor Actuat A-Phys 132(1):78–84. doi: 10.1016/j.sna.2006.04.057
4. Charlot B, Mir S, Parrain F, Courtois B. Generation of electrically induced stimuli for MEMS self-test. J Electron Test Theory Appl 17(6):459–470. doi: 10.1023/A:1012860420235
5. Cory BD, Kapur R, Underwood B (2003) Speed binning with path delay test in 150-nm technology. IEEE Des Test Comput 20(5):41–45. doi: 10.1109/MDT.2003.1232255
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