Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-019-05806-y.pdf
Reference18 articles.
1. Chapter two: The method of successive approximations. In: Bellman R, Cooke KL, Lockett JA (eds) Algorithms Graphs and Computers. Mathematics in Science and Engineering, vol 62, pp 49– 100. Elsevier (1970). https://doi.org/10.1016/S0076-5392(08)61895-0 . http://www.sciencedirect.com/science/article/pii/S0076539208618950
2. Anghel L, Benabdenbi M, Bosio A, Traiola M, Vatajelu EI (2018) Test and reliability in approximate computing. Journal of Electronic Testing. https://doi.org/10.1007/s10836-018-5734-9
3. Baumann RC (2005) Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans Device Mater Reliab 5(3):305–316. https://doi.org/10.1109/TDMR.2005.853449
4. Buchner SP, Miller F, Pouget V, McMorrow DP (2013) Pulsed-laser testing for single-event effects investigations. IEEE Trans Nucl Sci 60(3):1852–1875. https://doi.org/10.1109/TNS.2013.2255312
5. Han J, Orshansky M (2013) Approximate computing: an emerging paradigm for energy-efficient design. In: Proc 18th IEEE European Test Symposium (ETS), pp 1–6. https://doi.org/10.1109/ETS.2013.6569370
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