Test and Reliability in Approximate Computing-Reference-Cited by-同舟云学术

Test and Reliability in Approximate Computing

Published:2018-05-31 Issue:4 Volume:34 Page:375-387
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Anghel Lorena,Benabdenbi Mounir,Bosio Alberto,Traiola Marcello,Vatajelu Elena Ioana^ORCID

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/article/10.1007/s10836-018-5734-9/fulltext.html

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4. Austin T et al (2005) Opportunities and challenges for better than worst-case design. In Proc. Asia and South Pacific Design Automation Conference (ASP-DAC), pages 2–7

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