A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements
Author:
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s10836-024-06098-7.pdf
Reference35 articles.
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3. Gadlage M, Roach A, Duncan A, Williams A, Bossev D, Kay M (2018) Multiple-cell upsets induced by single high-energy electrons. IEEE Trans Nucl Sci 65(1):211–216. https://doi.org/10.1109/TNS.2017.2756441
4. Ebara M, Yamada K, Kojima K, Furuta J, Kobayashi K (2019) Process dependence of soft errors induced by alpha particles, heavy ions, and high energy neutrons on flip flops in FDSOI. IEEE Journal of the Electron Devices Society 7:817–824. https://doi.org/10.1109/JEDS.2019.2907299
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