Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns-Reference-Cited by-同舟云学术

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Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns

Published:2010-10 Issue:5 Volume:26 Page:513-521
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Al-Yamani Ahmad A.,McCluskey Edward J.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-010-5172-9.pdf

Reference32 articles.

1. Al-Yamani A, McCluskey EJ (2003) Built-in reseeding for serial BIST. VLSI Test Symposium. Apr

2. Al-Yamani A, McCluskey EJ (2003) Seed encoding with LFSRs and cellular automata. Design Automation Conference, June

3. Al-Yamani A, Mitra S, McCluskey EJ (2003) BIST Reseeding with very few seeds. VTS, Apr

4. Al-Yamani AA, Mitra S, McCluskey EJ (2005) Optimized reseeding by seed ordering and encoding. IEEE Trans Computer Aided Design (TCAD’05) 24(2):264–271, 2005

5. Balakrishnan KJ (2007) Efficient scan-based BIST using multiple LFSRs and dictionary coding. IEEE International Conference on VLSI Design pp 345–350, Jan

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform;Journal of Electronic Testing;2012-05-09

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