Author:
Hsieh Tong-Yu,Wang Chih-Hao,Kuo Chun-Wei,Huang Shu-Yu,Chih Tsung-Liang
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference39 articles.
1. Agarwal A, Paul BC, Roy K (2004) A novel fault tolerant cache to improve yield in nanometer technologies. Proc Int On-Line Test Symp 149–154
2. Almukhaizim S, Petrov P, Orailoglu A (2001) Faults in processor control subsystems: testing correctness and performance faults in the data prefetching unit. Proc Asian Test Symp 319–324
3. Almukhaizim S, Petrov P, Orailoglu A (2001) Low-cost, software-based self-test methodologies for pdf in processor control sub-systems. Proc IEEE Conf Custom Integr Circ 263–266
4. Almukhaizim S, Verdel T, Makris Y (2003) Cost-effective graceful degradation in speculative processor subsystems: the branch prediction case. Proc Int Conf Comput Des 194–197
5. Almukhaizim S, Sinaoglu O (2011) Error-resilient design of branch predictors for effective yield improvement. Proc Latin Am Test Workshop 1–6
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