A Layout-Based Rad-Hard DICE Flip-Flop Design
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/article/10.1007/s10836-019-05773-4/fulltext.html
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3. Baze MP, Hughlock B, Wert J, Tostenrude J, Massengill L, Amusan O, Lacoe R, Lilja K, Johnson M (2008) Angular dependence of single event sensitivity in hardened flip/flop designs. IEEE Trans Nucl Sci 55(6):3295–3301
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5. Cabanas-Holmen M, Cannon EH, Rabaa S, Amort T, Ballast J, Carson M, Lam D, Brees R (2013) Robust SEU mitigation of 32 nm dual redundant Flip-flops through interleaving and sensitive node-pair spacing. IEEE Trans Nucl Sci 60(6):4374–4380
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