Radiation Effects of Advanced Electronic Devices and Circuits-Reference-Cited by-同舟云学术

Radiation Effects of Advanced Electronic Devices and Circuits

Published:2024-03-14 Issue:6 Volume:13 Page:1073
ISSN:2079-9292
Container-title:Electronics
language:en
Short-container-title:Electronics

Author:

Chi Yaqing¹²^ORCID,Cai Chang³^ORCID,Cai Li⁴

Affiliation:

1. College of Computer, National University of Defense Technology, Changsha 410073, China

2. Key Laboratory of Advanced Microprocessor Chips and Systems, National University of Defense Technology, Changsha 410073, China

3. State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China

4. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China

Abstract

Research on the effects of radiation on advanced electronic devices and integrated circuits has experienced rapid growth over the last few years, resulting in many approaches being developed for the modeling of radiation’s effects and the design of advanced radiation-hardened electronic devices and integrated circuits [...]

Funder

National Natural Science Foundation of China

CAS Talent Program Youth Project

Innovation Center for Radiation Application

Publisher

MDPI AG

Link

https://www.mdpi.com/2079-9292/13/6/1073/pdf

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