A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits

Published:2017-01-11 Issue:1 Volume:33 Page:25-36
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Wali I.,Deveautour B.,Virazel Arnaud,Bosio A.,Girard P.,Sonza Reorda M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-017-5640-6.pdf

Reference19 articles.

1. Asadi H and Tahoori MB. (2006) Soft error derating computation in sequential circuits. In: Computer-Aided Design, 2006. ICCAD ‘06. IEEE/ACM International Conference on. 2006, pp. 497–501. doi: 10.1109/ICCAD.2006.320164

2. Avižiens A (1976) Fault-Tolerant Systems. IEEE Trans Comput C-25(12):1304–1312 . doi: 10.1109/TC.1976.1674598 ISSN: 0018-9340

3. Bottoni C, Coeffic B, Daveau JM, Naviner L and Roche P, (2015) Partial triplication of a sparc-v8 microprocessor using fault injection. Latin American Symposium on Circuits Systems, pp. 1–4

4. Fazeli M, Ahmadian S, Miremadi S, Asadi H, Tahoori M, (2011) Soft error rate estimation of digital circuits in the presence of multiple event transients (mets). Design Automation and Test in Europe Conference, pp. 1–6

5. Franco DT, Vasconcelos MC, Naviner L, and Naviner JF. (2008) Reliability analysis of logic circuits based on signal probability. In: Electronics, Circuits and Systems, ICECS 2008. 15th IEEE International Conference on. 2008, pp. 670–673. doi: 10.1109/ICECS.2008.4674942

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast Error Propagation Probability Estimates by Answer Set Programming and Approximate Model Counting;IEEE Access;2022

2. Test and Reliability of Approximate Hardware;Approximate Computing;2022

3. Reduced Precision Redundancy for Reliable Processing of Data;IEEE Transactions on Emerging Topics in Computing;2021-10-01

4. Reliability Analysis in Less than 200 Lines of Code;2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS);2021-02-21

5. Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features;2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS);2020-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3