Test and Reliability of Approximate Hardware-Reference-Cited by-同舟云学术

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Test and Reliability of Approximate Hardware

Published:2022 Issue: Volume: Page:233-266
ISSN:
Container-title:Approximate Computing
language:
Short-container-title:

Author:

Traiola Marcello,Deveautour Bastien,Bosio Alberto,Girard Patrick,Virazel Arnaud

Publisher

Springer International Publishing

Link

https://link.springer.com/content/pdf/10.1007/978-3-030-98347-5_10

Reference89 articles.

1. Al-Maaitah K, Qiqieh I, Soltan A, Yakovlev A. Configurable-accuracy approximate adder design with light-weight fast convergence error recovery circuit. In: 2017 IEEE Jordan conference on applied electrical engineering and computing technologies (AEECT). 2017. pp. 1–6. https://doi.org/10.1109/AEECT.2017.8257753.

2. Anghel L, Benabdenbi M, Bosio A, Traiola M, Vatajelu EI. Test and reliability in approximate computing. J Electron Test. 2018;34(4):375–87. https://doi.org/10.1007/s10836-018-5734-9.

3. Avirneni NDP, Somani A. Low overhead soft error mitigation techniques for high-performance and aggressive designs. IEEE Trans Comput. 2012;61(4):488–501. https://doi.org/10.1109/TC.2011.31

4. Avizienis A, Laprie JC, Randell B. Fundamental concepts of dependability. 2001. http://www.cs.ncl.ac.uk/publications/trs/papers/739.pdf.

5. Benedetto J, Eaton P, Avery K, Mavis D, Gadlage M, Turflinger T, Dodd P, Vizkelethyd G. Heavy ion-induced digital single-event transients in deep submicron processes. IEEE Trans Nuclear Sci. 2004;51(6):3480–85. https://doi.org/10.1109/TNS.2004.839173.

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1. Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03

2. Investigating the effect of approximate multipliers on the resilience of a systolic array DNN accelerator;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

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