Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
https://link.springer.com/content/pdf/10.1007/s10836-020-05922-0.pdf
Reference24 articles.
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3. He W, He Y, Li B, Zhang C (2019) Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation. IET Sci Meas Technol 13(2):318–327
4. Karthi SP, Shanthi M, Bhuvaneswari MC, (2014) Parametric fault diagnosis in analog circuit using genetic algorithm. Proc. International Conference on Green Computing Communication and Electrical Engineering (ICGCCEE), Coimbatore, pp 1–5. https://doi.org/10.1109/ICGCCEE.2014.6921410
5. Wang L-T, Wu C–W, Wen X–G (2006) VLSI test principles and architectures. Morgan Kaufmann Publishers, San Francisco
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