Electromagnetic Parameters Measurement of Sheet Using Separate Microstrip Line
Author:
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-019-05809-9.pdf
Reference16 articles.
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2. Baker-Jarvis J, Vanzura EJ, Kissick WA (1990) Improved technique for determining complex permittivity with the transmission/reflection method. IEEE Trans Microwave Theory Tech 38(8):1096–1103
3. Caijun Z, Quanxing J, Shenhui J (2011) Calibration-independent and position-insensitive transmission/reflection method for permittivity measurement with one sample in coaxial line. IEEE Trans Electromagnetic Compat 53(3):684–689
4. Chen LF, Ong CK, Neo CP, Varadan VV, Varadan VK (2004) In: Wiley J, Chichester E (eds) Microwave electronics: measurement and materials characterization, pp 195–197
5. Das NK, Voda SM, Pozar DM (1987) Two methods for the measurement of substrate dielectric constant. IEEE Trans Microwave Theory Tech 35(7):636–642
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