Two Methods for the Measurement of Substrate Dielectric Constant-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Two Methods for the Measurement of Substrate Dielectric Constant

Published:1987-07 Issue:7 Volume:35 Page:636-642
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Das N.K.,Voda S.M.,Pozar D.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx6/22/25172/01133722.pdf?arnumber=1133722

Cited by 78 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Adaptive ultra-lightweight patch antenna using Shape Memory Polymer;AIAA SCITECH 2024 Forum;2024-01-04

2. A Method of Precise Measurement to Distinguish the Insertion-Loss Variance of Microstrip Lines With Different Metal Strips;IEEE Transactions on Instrumentation and Measurement;2024

3. Microwave-Range Dielectric Characterization of Nematic Liquid Crystal Using Multisection Transformer Based on Two-Line Method;IEEE Sensors Letters;2023-12

4. VNA Instrumental Phase Error Influence on the Calculation Accuracy of the Dielectric Permittivity;2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE);2023-11-10

5. None-radiative Method to Characterize Paper Substrates at mmWave;2023 International Conference on Advanced Technologies for Communications (ATC);2023-10-19

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP