Design Considerations for High Performance RF Cores Based on Process Variation Study

Author:

Upadhyaya Shambhu,Venugopal Nandakumar P.,Shastry Nihal,Gopalakrishnan Srinivasan,Kuppuswamy Bharath V.,Bhowmick Rana,Mayor Prerna

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Reference18 articles.

1. Agarwal A, Blaauw D, Zolotov V (2003) Statistical timing analysis for intra-die process variations with spatial correlations. In: International conference on computer aided design, Nov 2003, pp 900–907

2. Arnold RG, Pedder DJ (1992) Microwave characterization of microstrip lines and spiral inductors in MCM-D technology. IEEE Trans Components Hybrids Manuf Technol 5(6):1038–1045 (Dec)

3. Arshak K, Abubaker O, Jafer E (2004) Design and simulation difference types CMOS phase frequency detector for high speed and low jitter PLL. In: Fifth IEEE international Caracas conference on devices, circuits and systems ICCDCS, Punta Cana, Dominican Republic, 3–5 Nov 2005, pp 188–191

4. Cheng Y (2002) The influence and modeling of process variation and device mismatch for analog/RF circuit design. In: Fourth IEEE international Caracas conference on devices, circuits and systems, April 2002

5. Chipcon. Chipcon: cc1000 transceiver chip manual. Chipcon AS, Oslo, Norway

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3