Author:
Ting Hsin-Wen,Lin Cheng-Wu,Liu Bin-Da,Chang Soon-Jyh
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference16 articles.
1. Azais F, Bernard S, Bertrand Y, Renovell M (2000) Towards an ADC BIST scheme using the histogram test technique. Proc IEEE European Test Workshop, pp 53–58, May
2. Baker RJ (2002) CMOS Mixed-Signal Circuit Design. IEEE Press, New York
3. Burns M, Roberts GW (2001) An Introduction to Mixed-Signal IC Test and Measurement. Oxford, New York
4. Huang JL, Ong CK, Cheng KT (2000) A BIST scheme for on-chip ADC and DAC testing. Proceedings of Design and Automation Conference, Europe, pp 216–220, Mar
5. Ishida K, Fujishima M (2003) Chopper-stabilized high-pass sigma delta modulator utilizing a resonator structure. IEEE Trans Circuits Syst II 50:627–631 (Sep)
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献