Author:
Deng Ding,Guo Yang,Li Zhentao
Funder
National Natural Science Foundation of China (CN)
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference31 articles.
1. Baik DH, Saluja KK, Kajihara S (2004) Random Access Scan: A solution to test power, test data volume and test time. Proc. International Conference on VLSI Design, pp 883–888
2. Basker P, Arulmurugan A (2012) Survey of low power testing of VLSI circuits. Proc. International Conference on Computer Communication and Informatics, pp 1–7
3. Bhattacharya BB, Seth SC, Zhang S (2003) Double-tree scan: A novel low-power scan-path architecture. Proc. International Test Conference, pp 470–479
4. Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits. Springer Science+Business Media, New York
5. Chandra A, Chakrabarty K (2001) Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. Proc. Design Automation Conference, pp.166–169.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Challenges in Low Power VLSI Design: A Review;2021 5th International Conference on Electronics, Communication and Aerospace Technology (ICECA);2021-12-02