Test Generation Algorithm for Linear Systems Based on Genetic Algorithm
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-010-5162-y.pdf
Reference16 articles.
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3. Ferguson FJ, Taylor M, Larrabee T (1990) Testing for parametric faults in static CMOS circuits. 1990 Test Conference 436–443
4. Gothenberg A, Tenhunen H (2004) Performance analysis of sampling switches in voltage and frequency domains using Volterra series. Proceedings of the 2004 International Symposium on Circuits and Systems I-765–I-768
5. Halder A, Chatterjee A (2004) Automated test generation and test point selection for specification test of analog circuits. 5th International Symposium on Electronic Design 401–406. doi: 10.1109/ISQED.2004.1283707
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