Test generation based diagnosis of device parameters for analog circuits
Author:
Publisher
IEEE Comput. Soc
Link
http://xplorestaging.ieee.org/ielx5/7307/19761/00915084.pdf?arnumber=915084
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware;2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID);2017-01
2. Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
3. Analog Circuit Fault Diagnosis via Sensitivity Computation;Journal of Electronic Testing;2015-02
4. Signature Driven Hierarchical Post-Manufacture Tuning of RF Systems for Performance and Power;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015-02
5. Global and local parametric diagnosis of analog short-channel CMOS circuits using homotopy-simplicial algorithm;International Journal of Circuit Theory and Applications;2013-03-22
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