On-Chip Delay Measurement Based Response Analysis for Timing Characterization

Author:

Datta Ramyanshu,Sebastine Antony,Raghunathan Ashwin,Carpenter Gary,Nowka Kevin,Abraham Jacob A.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Novel All-Digital on-Chip Aging Sensor Robust to Process Variations;2022 7th International Conference on Integrated Circuits and Microsystems (ICICM);2022-10-28

2. Delay Testable Design Using Modified Boundary Scan;Journal of The Japan Institute of Electronics Packaging;2021-11-01

3. Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2017

4. Trends in 3D Integrated Circuit (3D-IC) Testing Technology;Three-Dimensional Integration of Semiconductors;2015

5. On Detecting Delay Faults Using Time-to-Digital Converter Embedded in Boundary Scan;IEICE Transactions on Information and Systems;2013

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