Trends in 3D Integrated Circuit (3D-IC) Testing Technology
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-18675-7_8
Reference61 articles.
1. Noia B, Chakrabarty K (2013) Pre-bond probing of through-silicon vias in 3-D stacked ICs. IEEE Trans Comput Aided Des Integr Circuits Syst 32(4):547–558
2. Noia B, Panth S, Chakrabarty K, Lim SK (2012) Scan test of die logic in 3D ICs using TSV probing. In: Proceedings of IEEE international test conference (ITC), pp 1–8
3. Chen PY, Wu CW, Kwai DM (2010) On-chip testing of blind and open-sleeve TSVs for 3D IC before bonding. In: Proceedings of IEEE VLSI test symposium (VTS), pp 263–268
4. Cho MK, Liu C, Kim DH, Lim SK, Mukhopadhyay S (2010) Design method and test structure to characterize and repair TSV defect induced signal degradation in 3D system. In: Proceedings of IEEE/ACM international conference on computer-aided design (ICCAD), pp 694–697
5. Cho MK, Liu C, Kim DH, Lim SK, Mukhopadhyay S (2011) Pre-bond and post-bond test and signal recovery structure to characterize and repair TSV defect induced signal degradation in 3-D system. IEEE Trans Compon Packag Manuf Technol 1(11):1718–1727
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3