Author:
D’Souza Anand L.,Hsiao Michael S.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference19 articles.
1. M.S. Abadir, J. Ferguson, and T.E. Kirkland, “Login Design Verification via Test Generation,” in IEEE Transactions on Computer-Aided Design, vol. 7, no. 1, pp. 138–148, 1988.
2. M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital System Testing and Testable Design, New York, NY: Computer Science Press, 1990.
3. V. Boppana and M. Fujita, “Modeling the Unknown! to Wards Model-Independent Fault and Error Diagnosis,” in Proc. Intl. Test Conf., 1998, pp. 1094–1101.
4. V. Boppana, R. Mukherjee, J. Jain, and M. Fujita, “Multiple Error Diagnosis Based on Xlists,” in Proc. Design Automation Conf., 1999, pp. 100–110.
5. P.-Y. Chung, Y.-M. Wang, and I.N. Hajj, “Diagnosis and Correction of Logic Design Errors in Digital Circuits,” in Proc. Design Automation Conf., 1993, pp. 503–508.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scalable Hardware Trojan Diagnosis;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2012-06
2. Multiple-Fault Diagnosis Using Faulty-Region Identification;2009 27th IEEE VLSI Test Symposium;2009-05