Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-009-5103-9.pdf
Reference37 articles.
1. Agrawal V (1997) Low-power design by hazard filtering. In: Proc intl conference on VLSI design, Hyderabad, 4–7 January 1997, pp 193–197
2. Almukhaizim S, et al (2006) Seamless integration of SER in rewiring-based design space exploration. In: Proc intl test conference, Santa Clara, 24–26 October 2006
3. Baumann R (2004) Soft errors in advanced computer systems. IEEE Des Test Comput 22:258–266
4. Boyd S et al (2005) Digital circuit optimization via geometric programming. Oper Res 53:899–932
5. Boyd S et al (2007) A tutorial on geometric programming. Optim Eng 8:67–127
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors;Journal of Circuits, Systems and Computers;2022-12
2. Study of the operation and SET robustness of a CMOS pulse stretching circuit;Microelectronics Reliability;2018-03
3. Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2015-10
4. A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs;Journal of Electronic Testing;2015-03-27
5. A practical metric for soft error vulnerability analysis of combinational circuits;Microelectronics Reliability;2015-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3