Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-005-2543-8.pdf
Reference21 articles.
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4. D. De Venuto, M.J. Ohletz, and B. Ricco. “On-Chip Signal Level Evaluation for Mixed-Signal ICs using Digital Windows Comparators,” Proceedings of the European Test Workshop (ETW01), 2001, pp. 68–72.
5. M.S. Dragic, I.M. Filanovsky, and M. Margala. “A Novel On-Chip Amplifier for Fast IDD Current Monitoring,” Analog Integrated Circuits and Signal Processing, vol. 41, nos. 2/3, pp. 185–198, 2004.
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1. Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor;Journal of Electronic Testing;2011-03-30
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