Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-011-5214-y.pdf
Reference22 articles.
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3. Arumí D, Rodríguez-Montañés R, Figueras J (2008) Experimental characterization of CMOS interconnect open defects. IEEE Trans Comput Aided Des Integr Circuits Syst 27:123–136. doi: 10.1109/TCAD.2007.907255
4. Chen CS, Lo JC, Xia T (2006) An indirect current sensing technique for IDDQ and IDDT tests. ACM Great Lakes Symposium VLSI: 235–240. doi: 0.1145/1127908.1127964
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Novel Practical Built-in Current Sensors;Journal of Electronic Testing;2012-07-21
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