Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
4 articles.
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1. BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-11
2. High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test;2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2022-07
3. Environment for Innovative University Research Training in the Field of Digital Test;2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE);2021-09-01
4. Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors;2020 23rd Euromicro Conference on Digital System Design (DSD);2020-08