Lateral lattice parameter variation measurement by means of a double crystal X-ray method with oscillating slit
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://link.springer.com/content/pdf/10.1007/BF01590412.pdf
Reference6 articles.
1. Pinsker Z. G.: Dynamical scattering of X-rays in crystals, Springer Verlag, Berlin, 1978, p. 318–323.
2. Jenichen B., Köhler R.: Phys. Status Solidi (a)65 (1981) 245, 535.
3. Nittono O., Shimizu S.: J. Cryst. Growth45 (1978) 476.
4. Holý V., Kuběna J.: Czech. J. Phys. B29 (1979) 1161.
5. Kishino S.: Adv. X-ray Anal.16 (1973) 367.
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