An X-ray double-crystal method utilizing non-parallel setting for measuring local lattice mismatches between epitaxial films and substrates-Reference-Cited by-同舟云学术

An X-ray double-crystal method utilizing non-parallel setting for measuring local lattice mismatches between epitaxial films and substrates

Published:1978-12 Issue: Volume:45 Page:476-481
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Nittono Osamu,Shimizu Saburo

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference13 articles.

1. The Optical Principles of the Diffraction of X-rays;James,1950

2. Notizen: Röntgenographische Abbildung des Verzerrungsfeldes einzelner Versetzungen in Germanium-Einkristallen

3. Direct Observation of Imperfections in Crystals;Kohra,1962

4. Direct Observation of Imperfections in Crystals;Bonse,1962

5. Doppeldiffraktometrische Transmissions-Topographie?

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