An evaluation of some commercial thick film resistor materials for strain gauges-Reference-Cited by-同舟云学术

An evaluation of some commercial thick film resistor materials for strain gauges

Published:1994-01 Issue:13 Volume:13 Page:992-995
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Hrovat M.,Holc J.,Belavič D.,Šoba S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00701448.pdf

Reference14 articles.

1. K. Hoffman, “An introduction to measurements using strain gages” (Hottinger Baldwin Messtechnik GmbH, Darmstadt, 1989).

2. N. White andA. Cranny,Hybrid Circuits 12 (1987) 32.

3. S. Satoh, Y. Takatsuji, F. Katoh and H. Hirata, in Proceedings of the 1991 International Symposium on Microelectronics ISHM-91, Orlando, 1991, p. 148.

4. O. Abe andY. Taketa, in Proceedings of the 1988 International Symposium on Microelectronics ISHM-88, Seattle, 1988, p. 217.

5. A. Cattaneo, R. Dell'acqua, G. Dell'orto, L. Pirozzi andC. Canali, in Proceedings of the 1980 International Symposium on Microelectronics ISHM-80, New York, 1980, p. 221.

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