CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization

Author:

Bounceur Ahcàne,Mir Salvador,Rolindez Luis,Simeu Emmanuel

Publisher

Springer US

Reference17 articles.

1. S. Sunter and N. Nagi. Test metrics for analog parametric faults. In Proc. VTS, 1999, pp. 226-234.

2. K.P. Parker. The Boundary Scan Handbook. Third Edition. Kluwer Acad-emic Publishers, 2003.

3. S. Mir, A. Rueda, D. Vázquez and J.-L. Huertas. Switch-level fault cover-age analysis of switched-capacitor systems. In IEEE Design Automation and Test Conference in Europe DATE-98, pages 810-814, Paris, France, February 1998.

4. S.J. Spinks, C.D. Chalk, I.M. Bell ans M. Zwolinski. Generation and Ver-ification of Tests for Analog Circuits Subject to Process Parameter Devi-ations, Journal of Electronic Testing: Theory and Applications, v. 20 n. 1, February 2004, pp. 11-23.

5. N. Ben-Hamida and B. Kaminska. Analog circuit testing based on sensitiv-ity computation. IEEE International Test Conferece, Baltimore, October 1993, pp. 652-661.

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods;IFIP Advances in Information and Communication Technology;2015

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