1. David Salomon, “Data Compression, The Complete Reference, Forth Edition”, Springer Publishers, 2007
2. J. Geuzebroek, E.J. Marinissen, A. Majhi, A. Glowatz, F. Hapke, “Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects”, in Proc. Int. Test Conference (ITC’07), pp. 1–10, 2007
3. J. Savir and S. Patil, “On Broad-Side Delay Test,” in Proc. VLSI 2 Symp. (VTS’94), pp. 284–290, 1994
4. R. Mattiuzzo, D. Appello C. Allsup, “Small Delay Defect Testing,” http://www.tmworld.com/article/CA6660051.html Test & Measurement World, 2009
5. Synopsys Inc., “TetraMAX ATPG, Automatic Test Pattern Generation,” Synopsys Datasheet, 2010