Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects-Reference-Cited by-同舟云学术

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Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects

Published:2007 Issue: Volume: Page:
ISSN:
Container-title:2007 IEEE International Test Conference
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Author:

Geuzebroek Jeroen,Marinissen Erik Jan,Majhi Ananta,Glowatz Andreas,Hapke Friedrich

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4437545/4437546/04437649.pdf?arnumber=4437649

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift;Journal of Electronic Testing;2023-04

2. Accurate Diagnosis of Cell Internal Defects with Multiple Excitation and Propagation Conditions;2022 IEEE International Test Conference India (ITC India);2022-07-24

3. Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality;Journal of Electronic Testing;2021-04

4. N -Detection Test Sets for Circuits with Multiple Independent Scan Chains;ACM Transactions on Design Automation of Electronic Systems;2016-09-22

5. Multiple detection test generation with diversified fault partitioning paths;Microprocessors and Microsystems;2014-08

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