1. Krishnaswamy, S.: Design, analysis, and test of logic circuits under uncertainty. Dissertation, University of Michigan at Ann Arbor (2008).
2. Rabey, J.M., Chankrakasan, A., Nikolic, B.: Digital Integrated Circuits. Prentice Hall, pp. 445–490 (2003).
3. Hu, C. Silicon nanoelectronics for the 21st century. Nanotechnology 10(2), 113–116 (1999).
4. Bahar, R.I., Lau, C., Hammerstrom, D., Marculescu, D., Harlow, J., Orailoglu, A., Joyner, W.H. Jr., Pedram, M.: Architectures for silicon nanoelectronics and beyond. Computer 40(1), 25–33 (2007).
5. Krishnaswamy, S., Viamontes, G.F., Markov, I.L., Hayes, J.P.: Accurate reliability evaluation and enhancement via probabilistic transfer matrices. Proceedings of Design, Automation and Test in Europe (DATE), pp. 282–287 (2005).