Finding a Minimal Leakage Vector in the Presence of Random PVT Variations Using Signal Probabilities

Author:

Jayakumar Nikhil,Paul Suganth,Garg Rajesh,Gulati Kanupriya,Khatri Sunil P.

Publisher

Springer US

Reference26 articles.

1. Abdollahi, A., Fallah, F., Pedram, M.: Runtime mechanisms for leakage current reduction in CMOS VLSI circuits. In: Proc., Symposium on Low Power Electronics and Design, pp. 213–218 (2002)

2. Agarwal, A., Blaauw, D., Zolotov, V., Sundareswaran, S., Zhao, M., Gala, K., Panda, R.: Statistical Delay Computation Considering Spatial Correlations. In: ASPDAC: Proceedings of the 2003 Conference on Asia South Pacific Design Automation, pp. 271–276. ACM Press, New York, NY, USA (2003). DOI http://doi.acm.org/10.1145/1119772.1119825

3. Agarwal, A., Kang, K., Roy, K.: Accurate Estimation and Modeling of Total Chip Leakage Considering Inter- & Intra-die Process Variations. In: ICCAD ’05: Proceedings of the 2005 IEEE/ACM International Conference on Computer-Aided design, pp. 736–741. IEEE Computer Society, Washington, DC, USA (2005)

4. Aloul, F., Hassoun, S., Sakallah, K., Blauuw, D.: Robust SAT-Based Search Algorithm for Leakage Power Reduction. In: Proc. Power and Timing Models and Simulation. Seville, Spain (2002)

5. Bhardwaj, S., Vrudhula, S.B.K.: Leakage Minimization of Nano-scale Circuits in the Presence of Systematic and Random Variations. In: Proceedings, 42nd Design Automation Conference, pp. 541–546 (2005)

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