Author:
Sivaraman Mukund,Strojwas Andrzej J.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automatic Test Generation;Wiley Encyclopedia of Computer Science and Engineering;2009-03-16
2. Automatic Testing;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27
3. An analytical delay model;Journal of Computer Science and Technology;1999-03