Fault Simulation Applications and Methods-Reference-Cited by-同舟云学术

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Fault Simulation Applications and Methods

Published:2010-10-15 Issue: Volume: Page:103-142
ISSN:
Container-title:Digital System Test and Testable Design
language:
Short-container-title:

Author:

Navabi Zainalabedin

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4419-7548-5_4.pdf

Reference21 articles.

1. Jha NK, Gupta S (2003) Testing of digital systems. Cambridge University Press, Cambridge

2. Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits, Kluwer, Dordrecht

3. Roth JP (1966) Diagnosis of automata failures: a calculus and a method. IBM J Res Dev 10(4):278–291

4. Agrawal VD, Agrawal P (1972) An automatic test generation system for illiac IV logic boards. IEEE Trans Comput C-21(9):1015–1017

5. Agrawal P, Agrawal VD (1975) Probabilistic analysis of random test generation method for irredundant combinational logic networks. IEEE Trans Comput C-24(7):691–695

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Application Development of Monitor and Diagnosis System Based on Simulation Platform;Theory, Methodology, Tools and Applications for Modeling and Simulation of Complex Systems;2016

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