Ultratrace characterization of AlSiCu sputter targets for Th, U and 35 other elements by neutron activation analysis-Reference-Cited by-同舟云学术

Ultratrace characterization of AlSiCu sputter targets for Th, U and 35 other elements by neutron activation analysis

Published:1996-07 Issue:2 Volume:207 Page:445-459
ISSN:0236-5731
Container-title:Journal of Radioanalytical and Nuclear Chemistry Articles
language:en
Short-container-title:Journal of Radioanalytical and Nuclear Chemistry, Articles

Author:

Lucic M.,Krivan V.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF02071249.pdf

Reference24 articles.

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2. R. F. BUNSHAH, Z. Metallkunde, 84 (1984) 840.

3. S. WOLF, R. N. TAUBER, Silicon Processing for the VLSI Era, Lattice Press, Sunset Beach, 1986.

4. H. M. ORTNER, W. BLÖDORN, G. FRIEDBACHER, M. GRASSERBAUER, V. KRIVAN, A. VIRAG, P. WILHARTITZ, G. WÜNSCH, Kontakte, 3 (1988) 39.

5. V. KRIVAN, Nachr. Chem. Techn. Lab., 39 (1991) 536.

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