Concentration profiles through thin oxide scales by ion-probe microanalysis-Reference-Cited by-同舟云学术

Concentration profiles through thin oxide scales by ion-probe microanalysis

Published:1973-02 Issue:2 Volume:4 Page:411-417
ISSN:0360-2133
Container-title:Metallurgical Transactions
language:en
Short-container-title:MT

Author:

Wright I. G.,Seltzer M. S.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Metals and Alloys,Mechanics of Materials,Condensed Matter Physics,Metals and Alloys,Mechanics of Materials,Condensed Matter Physics

Link

http://link.springer.com/content/pdf/10.1007/BF02648692.pdf

Reference8 articles.

1. G. C. Wood: inPhysicochemical Measurements in Metals Research, R. F. Bunshah and R. A. Rapp, eds., Oxidation of Metals, Ch. 10, vol. IV, part 2, Wiley-Interscience, New York, 1970.

2. G. C. Wood and D. P. Whittle:Con. Sci., 1964, vol. 4, p. 263.

3. R. E. Pawel, J. P. Pemsler, and C. A. Evans:J. Electrochem. Soc., 1972, vol. 119, p. 24.

4. J. Stringer, B. A. Wilcox, and R. I. Jaffee:Oxid. Metals, 1972, vol. 5, p. 11.

5. C. E. Lowell, D. L. Deadmore, S. J. Grisaffe, and I. L. Drell: NASA Technical Note D-6290, April, 1971.

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