Supercomputer Stochastic Simulation of Transient Anisotropic Diffusion-Reaction Processes with Application in Cathodoluminescence Imaging
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-28163-2_19
Reference26 articles.
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3. Hauser, A.J., et al.: Characterization of electronic structure and defect states of thin epitaxial $${\rm BiFeO}_3$$ films by UV-visible absorption and cathodoluminescence spectroscopies. Appl. Phys. Lett. 92, 222901 (2008). https://doi.org/10.1063/1.2939101
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