Author:
Yuan Tao,Bae Suk Joo,Kuo Yue
Publisher
Springer International Publishing
Reference24 articles.
1. Bae, S. J., Hwang, J. Y., & Kuo, W. (2007). Yield prediction via spatial modeling of clustered defect counts across a wafer map. IIE Transactions, 39, 1073–1083.
2. Barnard, J., McCulloch, R., & Meng, X. L. (2000). Modeling covariance matrices in terms of standard deviation and correlations, with application to shrinkage. Stat Sinica, 10, 1281–1311.
3. Chen, A., & Hong, A. (2010). Sample-efficient regression true (SERT) for semiconductor yield loss analysis. IEEE Transactions on Semiconductor Manufacturing, 23, 358–369.
4. Congdon, P. (1992). Bayesian statistical modeling. New York: Wiley.
5. Gelman, A., Carlin, J. B., Stern, H. S., & Rubin, D. B. (2003). Bayesian data analysis, 2nd Edn. Boca Raton, FL: Chapman & Hall/CRC.