An Introduction of the Phosphor-Converted White LED Packaging and Its Reliability
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-49991-4_18
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3. Chang, M.H., et al.: Light emitting diodes reliability review. Microelectron. Reliab. 52, 762–782 (2012)
4. Fu, J., et al.: Degradation and corresponding failure mechanism for GaN-based LEDs. AIP Adv. 6, 055219 (2016)
5. Huh, C., et al.: Improvement in light-output efficiency of InGaN/GaN multiple-quantum well light-emitting diodes by current blocking layer. J. Appl. Phys. 92, 2248–2250 (2002)
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