Author:
Gundi Noel Daniel,Basu Prabal,Roy Sanghamitra,Chakraborty Koushik
Publisher
Springer International Publishing
Reference35 articles.
1. D.K. Schroder, Negative bias temperature instability: what do we understand? Microelectron. Reliab. 47(6), 841–852 (2007)
2. A.K. Mishra, N. Vijaykrishnan, C.R. Das, A case for heterogeneous on-chip interconnects for CMPs, in ACM SIGARCH Computer Architecture News (2011), pp. 389–400
3. K. Bhardwaj, K. Chakraborty, S. Roy, An MILP based aging aware routing algorithm for NoCs, in Proceedings of the IEEE/ACM Design Automation and Test in Europe (2012), pp. 326–331
4. E. Takeda, Y. Nakagome, H. Kume, S. Asai, New hot-carrier injection and device degradation in submicron MOSFETs. IEEE Proc. I (Solid-State Electron Dev.) 130(3), 144–150 (1983)
5. T. Ning, C. Osburn, H. Yu, Emission probability of hot electrons from silicon into silicon dioxide. J. Appl. Phys. 48(1), 286–293 (1977)