At-Wavelength Optics Characterisation via X-ray Speckle- and Grating-Based Unified Modulated Pattern Analysis
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-66329-2_7
Reference65 articles.
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4. Bérujon S, Wang H, Sawhney KJS (2013) At-wavelength metrology using the X-ray speckle tracking technique: case study of a X-ray compound refractive lens. J Phys Conf Ser 425(5):052020
5. Bérujon S, Wang H, Alcock S, Sawhney K (2014) At-wavelength metrology of hard X-ray mirror using near field speckle. Opt Express 22(6):6438–6446
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