Author:
Brendler Leonardo H.,Zimpeck Alexandra L.,Meinhardt Cristina,Reis Ricardo
Publisher
Springer International Publishing
Reference45 articles.
1. Baumann, R.: The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction. In: Digest. International Electron Devices Meeting, pp. 329–332. IEEE (2002)
2. Heidel, D.F., et al.: Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM. IEEE Trans. Nuclear Sci. 56(6), 3499–3504 (2009)
3. Boudenot, J.C.: Radiation space environment. In: Velazco, R., Fouillat, P., Reis, R. (eds.) Radiation Effects on Embedded Systems, pp. 1–9. Springer, Dordrecht (2007).
https://doi.org/10.1007/978-1-4020-5646-8
4. Stassinopoulos, E., Raymond, J.P.: The space radiation environment for electronics. Proc. IEEE 76(11), 1423–1442 (1988)
5. Gadlage, M.J., et al.: Scaling trends in set pulse widths in sub-100 nm bulk CMOS processes. IEEE Trans. Nuclear Sci. 57(6), 3336–3341 (2010)