DRAM Performance Sensor
Author:
Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-05028-2_34
Reference13 articles.
1. Semião, J., Santos, H., Cabral, R., Santos, M. B., Teixeira, P.: PVTA-aware performance SRAM sensor for IoT applications. In: Monteiro, J., et al. (eds.) INCREaSE, pp. 337–353. Springer, Cham (2020). https://doi.org/10.1007/978-3-030-30938-1_27
2. Semião, J., et al.: Signal integrity enhancement in digital circuits. In: IEEE Design and Test of Computers, vol. 25, no. 5, pp. 452–461, September–October 2008. http://dx.doi.org/10.1109/MDT.2008.146
3. Wang, W., et al.: The impact of NBTI on the performance of combinational and sequential circuits. In: Proceedings of the ACM/IEEE Design Automation Conference, pp. 364–369, San Diego, CA, USA, 4–8 June 2007. http://dx.doi.org/10.1109/DAC.2007.375188
4. Kim, T., Kong, Z.: Impact analysis of NBTI/PBTI on SRAM VMIN and design techniques for improved SRAM VMIN. J. Semicond. Technol. Sci. 13(2), 87–97 (2013). https://doi.org/10.5573/JSTS.2013.13.2.87
5. Ceratti, A., Copetti, T., Bolzani, L., Vargas, F.: On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2012, pp. 354–359, Tallinn, Estonia, 18–20 April 2012. http://dx.doi.org/10.1109/DDECS.2012.6219087
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