PVTA-Aware Performance SRAM Sensor for IoT Applications

Author:

Semião J.ORCID,Santos H.,Cabral R.ORCID,Santos M. B.ORCID,Teixeira P.ORCID

Publisher

Springer International Publishing

Reference23 articles.

1. Kim, T., Kong, Z.: Impact analysis of NBTI/PBTI on SRAM VMIN and design techniques for improved SRAM VMIN. J. Semicond. Technol. Sci. 13(2), 87–97 (2013). https://doi.org/10.5573/JSTS.2013.13.2.87

2. Ceratti, A., Copetti, T., Bolzani, L., Vargas, F.: On-chip aging sensor to monitor NBTI effect in nano-scale SRAM. In: Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2012, pp. 354–359, Tallinn, Estonia, 18–20 April 2012. http://dx.doi.org/10.1109/DDECS.2012.6219087

3. Semião, J., Cabral, R., Leong, C., Santos, M., Teixeira, I., Teixeira, J.: Dynamic voltage scaling with fault-tolerance for lifetime operation. In: The 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2015)/DATE 2015 Workshop W06, Grenoble, France, 13 March 2015

4. Semiao, J., Romao, A., Saraiva, D., Leong, C., Santos, M., Teixeira, I., Teixeira, P.: Performance sensor for tolerance and predictive detection of delay-faults. In: Proceedings of the International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2014, Amsterdam, The Netherlands, 1–3 October 2014. http://dx.doi.org/10.1109/DFT.2014.6962092

5. Martins, C., Semião, J., Vazquez, J., Champac, V., Santos, M., Teixeira, I., Teixeira, P.: Adaptive error-prediction flip-flop for performance failure prediction with aging sensors. In: IEEE 29th-VLSI Test Symposium (VTS), Dana Point, CA, USA, 1–5 May 2011, pp. 203–208 (2011). http://dx.doi.org/10.1109/VTS.2011.5783784

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1. DRAM Performance Sensor;Lecture Notes in Computer Science;2022

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