Publisher
Springer International Publishing
Cited by
2 articles.
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1. Ion-induced transformation of shallow defects into deep-level defects in GaN epilayers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-07
2. Disorder induced in GaN thin films by 200 MeV silver ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-06