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2. Hamrol, A., Kujawińska, A., Bożek, M.: Quality inspection planning within a multistage manufacturing process based on the added value criterion. Int. J. Adv. Manuf. Technol. 108, 1–14 (2020)
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4. Baygini, M., Aygin, M.: Deep learning based approaches for machine vision inspection applications. In: International Conference on Advanced Technologies, ICAT 2018, p. 63 (2018)
5. Materials from the company OMRON